KION provides
New FAB Services
for Nanotechnology
국가나노인프라협의체에서
새로운 팹서비스를 제공합니다.
공지사항
더보기- 2026년 모아팹 이용자만족도 조사 안내 2026.08.07
- 나노인프라 공정서비스역량 고도화사업 실증화 지원 수혜기업 모집 재공고 2026.06.29
- 나노인프라 공정서비스역량 고도화사업 실증화 지원 수혜기업 모집 공고 2026.06.17
- NICE아이디 시스템 6월 정기작업에 따른 서비스 영향 안내(6/20(토) 23:00 ~ 6/21(일) 06:00) 2026.05.27
- 모아팹 서버 장비 교체로 인한 서비스 중단 안내(5/18(월) 19:00 ~ 20:00) 2026.05.15
공정장비 검색
Secondary Ion Mass Spectrometry (SIMS)
3차원 프로파일러3D Profiler
3D Atom Probe Tomography (LEAP4000X HR) 13D Atom Probe Tomography (LEAP4000X HR) 1
3D Conforcal Scanning Microscope (3DCSM)3D Conforcal Scanning Microscope (3DCSM)
4단 면저항 측정기-14 Point Probe - 1
8인치 트렉 시스템-2 (SVS)PR Track_SVS - 2
8인치 트렉 시스템-3 (SVS)PR Track_SVS - 3
감광제 제거 시스템-ⅡPR Asher_FEOL - 2
감광제 제거 시스템-IPR Asher_FEOL - 1
고온 습식/건식 산화로Furnace Oxidation_LEAD
고온이온주입장치SiC ion implantation
광학현미경-DiffusionOptical Microscopes-Diffusion
광학현미경-EBLOptical Microscopes-EBL
광학현미경-EtchOptical Microscopes - Etch
광학현미경-IOptical Microscopes - Photo
광학현미경-THinFilmOptical Microscopes - ThinFilm
구면수차보정 투과전자현미경HR FE-TEM-Ⅱ (2200FS with Image Cs Corrector)
구면수차보정 투과전자현미경HR FE-TEM-Ⅰ (2100F with Probe Cs-Corrector)
급속열산화막용 급속열처리기RTP for RTO
노광기-2I-Line Stepper - 2
노광기-4I-Line Stepper - 4
마스크리스 레이저 리소그래피 시스템Maskless laser lithography system
마스크얼라이너Mask Aligner_MA6
물리증착장치(스퍼터)- IISputter_ENDURA - 2
박막두께측정기Spectroscopic Ellipsometer
선폭&표면 측정장치CD&Surface inspection system
세정 및 에칭장치Wet Station_Acid - 1
스트레스측정시스템Stress Measurement System
스핀건조기Spin Rinse Dryer
알파스텝(ME)Alpha-Step (ME)
원자층증착장치Atomic Layer Deposition (ALD)
임계치수 측정 주사현미경CD-SEM
자외선 트렉 시스템PR Track_DAVID
저압 화학증착장치LP-CVD
전계 방출형 주사전자현미경[Hitachi S-4800] High Resolution FE-SEM- Ⅲ
전계 방출형 주사전자현미경[JSM 7800F PRIME with Dual EDS] High Resolution FE-SEM-Ⅱ
전계 방출형 주사전자현미경[JSM 7401F] High Resolution FE-SEM-I
전계방출전자현미경HR FE-SEM (in Clean Room)
전자빔 증착장비E-beam Evaporator-2
전자빔리소그래피시스템-1E-Beam Lithography System - 1
전자빔리소그래픽시스템-2E-Beam Lithography System - 2
전자빔증착기-1E-Beam Evaporator - 1
절연막건식 식각 장비Dry Etcher - TEL
커브트레이서 및 프로브 스테이션Curve Tracer & Probe Station
프로브스테이션_파워반도체(소자)Probe Station_Power Semiconductor
플라즈마 유도결합 식각장치Dry Etcher_DMS
플라즈마증착장치 - P5000PE-CVD - P5000
플라즈마증착장치-1PE-CVD-1
플라즈마증착장치-2PE-CVD-2
AP-CVDAP-CVD
APLT SPEED-200iDAPLT SPEED-200iD
Atomic Force Microscope-Ⅰ(D 3100) / AFM-ⅠAtomic Force Microscope-Ⅰ(D 3100) / AFM-Ⅰ
Atomic Force Microscope-Ⅱ(Jupiter XR) / AFM - ⅡAtomic Force Microscope-Ⅱ(Jupiter XR) / AFM - Ⅱ
Cutting/Grinding/Polishing SystemCutting/Grinding/Polishing System
DC&RF 물리증착장비DC&RF Sputtering system
Deep Reactive Ion Etcher(DRIE) - 1Deep Reactive Ion Etcher(DRIE) - 1
Deep Reactive Ion Etcher(DRIE) - 2Deep Reactive Ion Etcher(DRIE) - 2
Dry Etcher_OxideDry Etcher_Oxide
Dry Etcher_Poly SiDry Etcher_Poly Si
Dry-Etcher_gigalaneDry-Etcher_gigalane
Focused Ion Beam -Ⅰ(Helios 600 with TKD) / FIB -ⅠFocused Ion Beam -Ⅰ(Helios 600 with TKD) / FIB -Ⅰ
Focused Ion Beam -Ⅱ(Helios 650 with EBSD) / FIB -ⅡFocused Ion Beam -Ⅱ(Helios 650 with EBSD) / FIB -Ⅱ
Focused Ion Beam -Ⅲ(Helios G3 CX) / FIB -ⅢFocused Ion Beam -Ⅲ(Helios G3 CX) / FIB -Ⅲ
Focused Ion Beam -Ⅳ(SMI 3050) / FIB - ⅣFocused Ion Beam -Ⅳ(SMI 3050) / FIB - Ⅳ
Furnace Activator_SiC 200Furnace Activator_SiC 200
Furnace High Temp anneal_SiCFurnace High Temp anneal_SiC
Furnace Metal AnnealFurnace Metal Anneal
High Resolution FE-SEM-Ⅳ (JSM-IT710HR)High Resolution FE-SEM-Ⅳ (JSM-IT710HR)
High Resolution Powder-XRDHigh Resolution Powder-XRD
ICP 식각 장치 - 2Dry-Etcher_Ulvac
ICP 식각장치Dry Etcher_ICP
I-Line Stepper - 1I-Line Stepper - 1
I-Line Stepper-3I-Line Stepper-3
Ion Beam ThinnerIon Beam Thinner
LPCVD FurnaceLPCVD Furnace
Mask Aligner_MA8Mask Aligner_MA8
Mask Aligner_MEMask Aligner_ME
MEMS Spin CoaterMEMS Spin Coater
MEMS Yellow Wet stationMEMS Yellow Wet station
MEMS Yellow Wet station - OrganicMEMS Yellow Wet station - Organic
Metal Lift-OffMetal Lift-Off
NEMS 제작을 위한 Base SystemNEMS Base System (optical microscope)
NEMS White Wet station - AcidNEMS White Wet station - Acid
NEMS White Wet station - OrganicNEMS White Wet station - Organic
Nikon KrF S204BNikon KrF S204B
PECVD System P-5000PECVD System P-5000
PR Asher for BEOLPR Asher for BEOL
PR Spin Coater_SawatecPR Spin Coater_Sawatec
PR Track_SVS - 1PR Track_SVS - 1
PR Track_TEL - 1PR Track_TEL - 1
PZT sputteringPZT sputtering
Raman Spectroscopy(Alpha 300 R)Raman Spectroscopy(Alpha 300 R)
RTP for SilicideRTP for Silicide
Sputter_ENDURA - 1Sputter_ENDURA - 1
TEL Spinner ACT8TEL Spinner ACT8
UHV-CVDUHV-CVD
UV/Vis/nIR SpectrometerUV/Vis/nIR Spectrometer
Wafer Laser MarkerWafer Laser Marker
Wet Station_Acid - 2Wet Station_Acid - 2
Wet Station_Acid - MetalWet Station_Acid - Metal